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2830 ZT

Advanced wavelength dispersive XRF analysis

Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.

2830 ZT, Axios FAST, Epsilon, X-Ray Fluorescence (XRF), Zetium »

[8 Dec 2017 | ]

The Malvern Panalytical Perth Office is organizing the “XRF in the workplace” training course from the 19 – 23 March 2018.
A second session will take place in Sydney from the 16 – 20 July 2018.
Serving to provide high-quality training for industry and research professionals, this 5-day course will focus on most facets of X-ray fluorescence (XRF) spectrometry. It will also include several classroom lectures and hands-on practical sessions on XRF and sample preparation techniques. This course is suitable for all users of XRF, regardless of the brand of your instrumentation.
Let’s …

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