Malvern will be attending Pittcon 2016 in Atlanta, Georgia and once again we are pleased to feature a number of our recognized characterization experts who will be presenting a variety of short courses throughout the week.
Below is a listing of our available short course offerings. Register now to receive a discounted rate on your registration.
We look forward to seeing you in Atlanta! Booth 3349
Monday, March 7, 2016
#16 – Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques – Alan Rawle & Ulf Nobbmann
A full 1-day course that will bring newcomers to the particle sizing field up to speed on the basics (including terminology, international standards and math) of particle size analysis. The main techniques (sieves, sedimentation, electrozone sensing) will be covered but the main emphasis will be on light scattering techniques in particular dynamic light scattering (DLS; 1 – 1000 nm approx.) and laser diffraction (0.1 – 3000 um approx.)
Wednesday, March 9, 2016
#113 – Separations: Fundamentals of Advanced Gel Permeation & Size Exclusion Chromatography Detection – Ulf Nobbmann
This ½ day course covers principles of advanced detection in GPC & SEC: Conventional chromatography relies solely on a concentration detector (RI, UV) to find Mw, Mn, PDI, %aggregation, by linking the elution to similar known standards. Universal Calibration avoids the need for similarity, exploiting the universal scaling of intrinsic viscosity. Light scattering provides the ‘absolute’ molecular weight directly. The different calibration techniques (conventional, universal, light scattering) will be covered with examples. The details of intrinsic viscosity and light scattering detection will include basics (principle of operation, math, caveats) and applications in real laboratory research & QAQC scenarios.
Thursday, March 10, 2016
#135 – Nanocrystallite and Nanoparticle Size Analysis with an X-Ray Diffractometer – Alan Rawle & Scott Speakman (PANalytical)
X-ray diffraction and small angle X-ray scattering (SAXS) are complementary techniques that can provide information about nanocrystallite size and nanoparticle size, respectively. Both techniques can be supported on a single modern X-ray diffractometer, making it easy to utilize the complementary nature of these techniques for the characterization of increasingly complex nanosystems. This 1-day course will introduce newcomers to the important aspects of data collection and analysis for X-ray diffraction and SAXS. The techniques discussed will also be useful to experience diffractionists looking to move beyond the simple Scherrer equation to more complex line profile analysis of nanocrystallite size and microstrain.
We really look forward to seeing you there soon!