Do you need a spectroradiometer and/or a spectrometer for your spectral data field research?


If so, Malvern Panalytical has two opportunities to submit proposals and receive free access to world-class ASD scientific instruments to support your research!

2018 Goetz Instrument Support Program


2015 Goetz Program Awardee, Omar Vergara Diaz (University of Barcelona) uses the FieldSpec® 4

Join a distinguished list of former program recipients and further your research!

Recently celebrating its 10th year, the Goetz Instrument Support Program provides graduate students with temporary use of one of our high-performance spectroradiometers – FieldSpec® 4 or FieldSpec Handheld 2 – to pursue their research endeavors.

The ASD FieldSpec line of spectroradiometers are portable, non-destructive and deliver fast and accurate spectral field measurements.

The deadline to submit your proposal is October 20, 2017 so don’t delay! You can learn more by viewing our program details and submission guidelines.

2018 ASD Students in Mining and Energy TerraSpec® Instrument Program


ASD’s TerraSpec Halo Mineral Identifier

The ASD Students in Mining and Energy TerraSpec® Instrument Program was developed to enhance innovation in the mining and energy industries by providing temporary use of a TerraSpec 4 Mineral Analyzer or a TerraSpec Halo Mineral Identifier to eligible students.

The TerraSpec line of spectrometers provides portable, rapid and non-destructive analysis of minerals in the laboratory or field. Recipients of the TerraSpec 4 are also given access to The Spectral Geologist (TSG) Pro mineral analysis software, which easily sorts and analyzes the high-quality spectral data collected by the instrument.


The deadline to submit your proposal is November 17, 2017. Learn about additional program information and submission guidelines so that you can enter today!

ASD Inc., a Malvern Panalytical company, is the global leader in high-performance analytical instrumentation solutions, solving some of the most challenging real-world materials measurement problems.