Since its launch in 2015, the Zetium X-ray fluorescence (XRF) spectrometer has set a new standard for elemental analysis. By combining various technologies within its SumXcore platform, the Zetium spectrometer has enabled our customers to do all sorts of new and interesting analyses on their production control systems. One of these types of analyses that regularly helps to improve product quality or optimize the production process, is the small spot measurement capability. As the product manager for the Zetium spectrometer, I was therefore very proud and enthusiastic to announce the latest addition to the SumXcore platform, namely the HiPer Small Spot Mapping functionality (HiPer SSM).

At Malvern Panalytical, we already choose a unique approach to Small Spot measurements on the Zetium spectrometer by using Energy Dispersive (ED) technology. We choose this route because of the advantages this technology provides for small spot measurements. When you have a need to better understand your production process, for instance due to a problem, you want to have an answer fast and you want to be sure nothing unexpected has entered your sample. These are exactly the benefits an ED-based small spot measurement offers, as an ED spectrum contains information on a range of simultaneously collected elements.

With the HiPer SSM, where HiPer stands for High Performance, we’ve been able to drastically improve the sensitivity of our small spot mapping functionality even further, through the development of unique X-ray optics. With this solution, you can measure an inclusion in just minutes and easily detect low levels of elements as light as Na. This has opened the possibility to perform all sorts of new analyses, such as the investigating into reaction kinetics of mortar as demonstrated in one of our application notes.

Customer experience

I enjoyed the feedback we got from one of our first HiPer SSM customers, who was now able to identify the root cause of production problems when they occurred. Previously, they had to make an educated guess or wait several days for an expensive SEM analysis. Now, they can put the sample in the spectrometer and get their production up and running again in a short period of time.

Discussing the new possibilities with our HiPer SSM functionality with several of our customers, has made me very enthusiastic about the developments we have pursued for the Zetium Spectrometer. If you would like to discuss how the HiPer SSM or the Zetium spectrometer can help you improve or control your production or R&D activities, please don’t hesitate to contact us via info@malvernpanalytical.com.

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