Please visit us in booth: 3911, 4011 to discuss your research, development and quality control and assurance challenges, as well as challenges educating the next generation of scientists and engineers. We look forward to discussing ways to maximize productivity, develop better quality products and get them to market faster. Our focus is on creating innovative, customer-focused solutions and services to enhance efficiency and deliver tangible economic impact through chemical, physical and structural analysis of materials.
In our booth, we’ll have the following Malvern Panalytical instruments on display:
- Zetasizer Pro – nanoparticle size and zeta potential
- Mastersizer 3000 – laser diffraction particle size analyzer
- Morpohologi 4 – automated image analysis and chemical ID
- Aeris – benchtop X-ray diffractometer (XRD)
- Epsilon 1 – X-ray fluorescence (XRF) elemental analyzers
- Claisse LeNeo – sample preparation for XRF and ICP
- ASD LabSpec 4 – portable near-infrared (NIR) spectrometer
- OMNISEC REVEAL – absolute molecular weight / molecular size / structure
- NanoSight – nanoparticle size distribution and concentration
Live systems available to demo are the Aeris, Epsilon 1, and Morphologi 4.
While in our booth 3911, accept the challenge and try to beat the Epsilon 1 XRF analyzer at a beer identification taste test held Tuesday 3/3 and Wednesday 3/4 in our booth’s specialized bar area!
- Monday, March 2 (SC1250; 8:30 am-5 pm) Alan Rawle presents on, “Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering.” Summary: A 1-day course that will bring newcomers to the particle sizing field up to speed on the basics (including terminology, international standards and math) of particle size analysis. The main techniques (sieves, sedimentation, electrical sensing zone) will be covered but the main emphasis will be on light scattering techniques in particular dynamic light scattering (DLS; 1 – 1000 nm approx.) and laser diffraction (0.1 –3000 microns approx.)
- Tuesday, March 3 (SC1251; 8:30 am-12:30 pm) – Alan Rawle presents on, “Sampling for Particle Size Analysis.” Summary: A ½-day course that will bring personnel in the particle sizing field up to speed on the importance of sampling for particle size analysis. The course will deal with 2 main objectives – determination of the minimum mass required for any required precision and the calculation of the best fundamental sampling error (FSE) based on the mass used in any particle size determination. We will point out the major issues with sampling including delimitation errors and provide limited advice as to the recommended routes to take a reasonable sample and the dangers of taking limited or unrepresentative samples. The course is suited to users of all particle size analysis techniques from sieves to light scattering.
- Tuesday, March 3 (SC1236; 1-5 pm) – Ana Morfesis presents on, “Dynamic Light Scattering, Nanoparticle Tracking Analysis, and Zeta Potential; Characterization of Nano-Materials.” Summary: The objectives are to discuss Dynamic Light Scattering, Nanoparticle Tracking Analysis, Molecular Weight and zeta potential methods. DLS and NTA are versatile and non-destructive measurement techniques that are ideally suited as a metrology of choice for size, stability and identification of nanomaterial, protein molecules, aggregates and emulsions or suspensions in solution. We will also discuss the importance of zeta potential in understanding interfacial behavior and the formulation of multi-component products. Discussions will include; the differences between sizing methods, theory, useful tips for sample preparation and analysis of measurement results, molecular weight, micro-rheology and zeta potential.
- Tuesday, March 3 (SC1265; 1-5 pm) – Carrie Schindler presents on, “Separations: Fundamentals of advanced Gel Permeation GPC & Size Exclusion SEC Chromatography Detection.” Summary: This ½ day course covers the theoretical and practical principles of GPC & SEC. We will discuss how light scattering overcomes the limitations of column calibration to provide a direct measurement of ‘absolute’ molecular weight, irrespective of the sample’s chemistry, composition, and structure. This course will discuss the principles behind the different advanced detectors and how sample molecular weight and other parameters can be measured. We will also discuss practical aspects of making high-quality GPC/SEC measurements and generating quality results. Finally, we will look at a series of application examples to see how these measurements can be applied to a wide range of applications and samples types.
See you at Pittcon 2020 this March!