Author Archives: Martijn Fransen

Martijn Fransen studied Experimental Physics at the Technical University of Delft, the Netherlands. In his Ph.D. work, carried out in collaboration with the Philips Research Laboratory in Eindhoven, the Netherlands, he investigated novel electron sources for electron microscopes based on carbon nanotubes using custom-built characterization equipment. He started within Philips/Malvern Panalytical in 1998 and has been involved in the creation and marketing of several key elements of the X-ray diffraction product line, such as X'Pert PRO, Empyrean, X'Celerator, the PIXcel detector family, GaliPIX, Aeris, and many more. Nowadays he is the Director of Structural Analysis, covering the XRD & NIR product lines

Published 7 Oct 2020

A data integrity solution for the regulated environment

I have worked in the analytical instrumentation business for X-ray diffraction (XRD) machines more than 20 years. In this time, technical innovation has always been the main driving force for new business. Can we measure faster? Increase detection limits? Add more applications? Switch between methods more quickly?…READ MORE >

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Published 5 Nov 2019

Why stick to reflection geometry in powder diffraction?

Since I made my first steps in the powder diffraction community, I have been amazed by the many possibilities for collecting diffractograms. In this blog, I’ll describe how I learned about the advantages of transmission geometry over reflection geometry for…READ MORE >

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