X-ray Diffraction (XRD)


XRD is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powders and solids to thin films and nanomaterials.

Published 7 Nov 2019

Improving safety in semiconductor manufacturing

As the semiconductor industry expands and gets more complex, the safety requirements in the manufacturing environment becomes even stricter. More and more semiconductor fabs require full compliancy to the SEMI-S2 standard. What is the SEMI-S2 standard? “Semiconductor Equipment and Materials…READ MORE >

Published 5 Nov 2019

Why stick to reflection geometry in powder diffraction?

Since I made my first steps in the powder diffraction community, I have been amazed by the many possibilities for collecting diffractograms. In this blog, I’ll describe how I learned about the advantages of transmission geometry over reflection geometry for…READ MORE >

Published 30 Oct 2019

Malvern Panalytical Presents: Spooky Stories in Materials Analysis

It’s in the crisp coolness of the air. The leaves are changing color. Fall season is upon us. We are in the midst of autumn and the feeling of eeriness is among us as Halloween approaches. Did you know? Our…READ MORE >

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Published 8 Oct 2019

Characterizing material properties for powder additive manufacturing

Up to one third of the production cost of an additive manufacturing (AM) component produced by powder bed processes (particularly metals) is the cost of the powder used, with commercial viability resting on a robust supply chain and effective powder…READ MORE >

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Published 11 Jun 2019

A Day in the Life of an XRD System at Georgia Tech

Many thanks to Dr. David Tavakoli, XRD Facilities Manager at Georgia Tech’s IEN/IMAT Materials Characterization Facility (MCF), and Christa Ernst, Marketing Manager at Georgia Tech’s Institute for Electronics and Nanotechnology (IEN). The collaboration for this article with Malvern Panalytical does not constitute…READ MORE >

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