X-ray Fluorescence (XRF)


XRF is a robust technique, combining high precision and accuracy with straightforward, fast sample preparation. It can be readily automated for use in high-throughput industrial environments, plus XRF provides both qualitative and quantitative types of information on a sample. Easy combination of this ‘what?’ and ‘how much?’ information also makes rapid screening (semi-quantitative) analysis possible.

The technology used for the separation (dispersion), identification and intensity measurement of a sample’s X-ray fluorescence spectrum gives rise to two main types of spectrometer: wavelength dispersive (WDXRF) and energy dispersive (EDXRF) systems.

Published 7 Nov 2019

Improving safety in semiconductor manufacturing

As the semiconductor industry expands and gets more complex, the safety requirements in the manufacturing environment becomes even stricter. More and more semiconductor fabs require full compliancy to the SEMI-S2 standard. What is the SEMI-S2 standard? “Semiconductor Equipment and Materials…READ MORE >

Published 24 Oct 2019

Understanding two major customer pains in sample preparation by fusion

Even though fusion is the best way to prepare samples prior to XRF analysis, some people are still annoyed with some points related to this technique. Here are two customer pain points explained. 1 – High accuracy of the weighing…READ MORE >

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Published 8 Oct 2019

Characterizing material properties for powder additive manufacturing

Up to one third of the production cost of an additive manufacturing (AM) component produced by powder bed processes (particularly metals) is the cost of the powder used, with commercial viability resting on a robust supply chain and effective powder…READ MORE >

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Published 3 Oct 2019

The Basics of Elemental Analysis with XRF – Free webinar series

X-ray fluorescence spectroscopy (XRF) is a powerful analytical technique that provides both qualitative and quantitative information on a wide variety of sample types including solids, liquids, slurries, and loose powders. It can quantify elements from beryllium (Be) up to americium…READ MORE >

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Published 19 Sep 2019

Use of NIR for Mineralogical Characterization of a Mudrock Sedimentary System

Authored by Somayeh Hosseininejad, former PhD candidate in the Department of Geoscience at the University of Calgary and 2014 ASD Students in Mining & Energy TerraSpec Instrument Program selected participant, provides a comparative look at Near-infrared (NIR), X-ray fluorescence (XRF) and…READ MORE >

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