Tag Archives: X-ray diffractometer


Published 14 May 2020

Basics to powder X-ray diffraction: How to achieve high-quality XRD patterns – Q&A

X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers, therefore, use XRD to analyze a wide range of materials, from powder…READ MORE >

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Published 18 Sep 2018

“What an intelligent machine” – a video testimonial for Aeris

In their own words, Louis C. Herring & Co. president Glenn Austin and lab supervisor David Fletcher talk about the recent addition of an Aeris X-ray diffractometer to their lab. The Aeris replaces a 1980’s vintage PW1840 benchtop X-Ray Diffraction…READ MORE >

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